Adjusts the baseline failure rate using specific environmental, temperature, and electrical stress factors calculated for each component. Method II: Combining Laboratory Test Data
Method II allows engineers to modify the Black Box predictions by integrating real-world laboratory test data. If a company runs accelerated life testing (ALT) or highly accelerated life testing (HALT) on a component or unit, the resulting statistical data is used to adjust the generic Telcordia failure rates, usually yielding a more accurate (and often more favorable) MTBF. Method III: The Field Tracking Method telcordia sr332 issue 3 pdf full
At the heart of Telcordia SR-332 is the part stress calculation formula. For a specific component, the predicted failure rate ( λsslambda sub s s end-sub ) is generally expressed as: telcordia sr332 issue 3 pdf full